Product Description
The IDE4184 is an application specific integrated circuit (ASIC), which has been designed for the readout of CdTe/CZT radiation detectors. The chip can be used for single photon spectroscopy of x-rays and γ-rays with energy between 20keV and 650keV and rate up to 92 kHz per chip. The chip contains 128 low-noise pre-amplifiers (130e ENC) each followed by a pulse shaper (adjustable peaking times from 0.35μs to 1μs) and a level comparator for triggering and address encoding. The amplifiers are optimized for negative polarity input charge up to -25fC maximum. When a charge from the detector exceeds one of the adjustable thresholds, the chip generates a trigger signal and delivers an analog signal proportional to the energy of the photon and an address corresponding to the triggering channel. The chip requires positive and negative voltage supplies (+1.5V and -2V) and one reference bias current to generate its internal bias currents. The total power consumption is 90 mW maximum. The chip has a 858-bit memory register, programmable via serial interface, which allows one to set various functions, program digital-to-analogue converters (DACs), and tune parameters. Each channel has an optional current compensation for detector leakage currents. All amplifier inputs are protected by diodes against over-voltage and electro-static discharge (ESD).
Publications
- L.R. Cenkeramaddi, et al., 2012, “Low-energy CZT detector array for the ASIM mission”, Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International , vol., no., pp.2119,2123, 13-16 May 2012, [DOI: 10.1109/I2MTC.2012.6229184]
Product Features
Detectors | CZT, CdTe |
Detectors | CZT, CdTe |
Application | Calorimetry, Imaging, Spectoscopy |
Number of inputs | 128 |
Input charge range | 0 fC to -25 fC |
Shaping time | 0.35 μs to 1 µs |
Nominal capacitive load | 240 pF |
Equivalent Noise Charge (ENC) | 130e (typical) |
Trigger threshold | Adjustable and programmable by 4 bit DAC |
Trigger outputs | Adress of triggered channel, multi-hit trigger |
Outputs | Multiplexed pulse height |
Test and calibration | Internal calibration circuit |