All Readout IC, and ASICs

CA3

CA3

Detectors: CZT, CdTe
Detectors: CZT, CdTe
Application: Counting, Imaging
Number of inputs: 32 / 64
Input charge range: 0 fC to -4.2 fC
Shaping time: 50 ns
Nominal capacitive load: 10 pF
Equivalent Noise Charge (ENC): 105e + 40e/pF
Trigger threshold: Adjustable per channel
Trigger outputs: Common trigger output for all channels
IDE1140

IDE1140

Detectors: Silicon (Si)
Detectors: Silicon (Si)
Application: Imaging, Spectroscopy, Calorimetry
Number of inputs: 64
Input charge range: ±200 fC
Shaping time: 5 µs to 8 μs
Nominal capacitive load: 50 pF
Equivalent Noise Charge (ENC): 98e + 6.5e/pF
Outputs: Multiplexed pulse height
Test and calibration: Internal calibration circuit
IDE1162

IDE1162

Detectors: Silicon (Si)
Detectors: Silicon (Si)
Application: Calorimetry, Spectroscopy
Number of inputs: 32
Input charge range: ±1.5 pC
Shaping time: 2 µs to 2.5 μs
Nominal capacitive load: 50 pF
Equivalent Noise Charge (ENC): 1900e + 2e/pF
Outputs: Multiplexed pulse height
Test and calibration: Calibration circuit and internal reference channel
IDE1180 AMADEUS

IDE1180 AMADEUS

Detectors: Micro-channel plate (MCP), GEM, RPC, MSGC, MWPC, TPC
Detectors: Micro-channel plate (MCP), GEM, RPC, MSGC, MWPC, TPC
Application: Calorimetry, Imaging, Spectroscopy
Number of inputs: 16
Input charge range: 4 gain settings: ±50, ±100, ±200, ±400 fC
Shaping time: 20 ns to 40 ns programmable
Nominal capacitive load: 5 pF
Equivalent Noise Charge (ENC): 900e
Outputs: 16 Parallel voltage outputs of sample-and-held signal
Test and calibration: Internal 5 pF calibration capacitor.
IDE3160

IDE3160

Detectors: PMT (photomultiplier tube)
Detectors: PMT (photomultiplier tube)
Application: Imaging, Spectroscopy, Calorimetry
Number of inputs: 32
Input charge range: ‐5 pC to +13 pC
Shaping time: 1.8 μs to 2.3 μs
Nominal capacitive load: 220 pF
Equivalent Noise Charge (ENC): 3200e + 7.6e/pF
Trigger threshold: Adjustable
Trigger outputs: Common trigger of 32 comparators
IDE3380

IDE3380

Detectors: SiPMs, PMTs, MPPCs
Application: External waveform sampling and digitization, time spectroscopy, pulse counting, triggering
Number of inputs: 16 current sensitive inputs (≤ 16 nC)
Input charge ranges: -16 nC, -8 nC, -4 nC, -0.4 nC
Shaping time: 200 ns, 400 ns, 800 ns, 1600 ns
Nominal capacitive load: Several nF
Equivalent Noise Charge: 2.53 pC (CMIS gain: 1/400), 0.12 pC (CMIS gain: 1/10)
Trigger threshold: Internal from charge discriminator via programmable threshold in every channel
Trigger outputs: External (trigger on input, trigger on sum)
Outputs: All channels are available and provides either the pulse height or a digital trigger/timing pulse, and sum
IDE3465

IDE3465

Detectors: Silicon (Si)
Detectors: Silicon (Si)
Application: Counting, Spectroscopy
Number of inputs: 20
Input charge range: LG: 0 pC to +26 pC, HG: 0 pC to +2.6 pC
Shaping time: 1 µs (VA), 250 ns (TA)
Nominal capacitive load: 10 pF to 30 pF
Equivalent Noise Charge (ENC): HG: 3500e, LG: 26000e
Trigger threshold: Programmable by 8-bit DAC
Trigger outputs: 2 Common triggers and 27 parallel trigger outputs
IDE3466

IDE3466

Detectors: Silicon (Si)
Detectors: Silicon (Si)
Application: Counting
Number of inputs: 32 High Gain, 4 Low Gain
Input charge range: 0 fC to 100 fC, 0-2.6 pC, 0-26 pC
Shaping time: 1 µs (VA), 250ns (TA)
Nominal capacitive load: 10 pF
Equivalent Noise Charge (ENC): 42000e (worst case maximum)
Trigger threshold: Programmable by 10-bit DAC
Trigger outputs: Common trigger for all channels
IDE4184

IDE4184

Detectors: CZT, CdTe
Detectors: CZT, CdTe
Application: Calorimetry, Imaging, Spectoscopy
Number of inputs: 128
Input charge range: 0 fC to -25 fC
Shaping time: 0.35 μs to 1 µs
Nominal capacitive load: 240 pF
Equivalent Noise Charge (ENC): 130e (typical)
Trigger threshold: Adjustable and programmable by 4 bit DAC
Trigger outputs: Adress of triggered channel, multi-hit trigger
IDE4281

IDE4281

Detectors: CZT, CdTe
Detectors: CZT, CdTe
Application: Counting, Spectroscopy
Number of inputs: 12
Input charge range: 12 0 fC to -5.14 fC
Shaping time: 0.75 µs to 4 µs programmable
Nominal capacitive load: 4 pF
Equivalent Noise Charge (ENC): 110e
Trigger threshold: Adjustable
Outputs: Multiplexed differential current and a digital interface for triggered readout packages.
IDE8410 NIRCA Prototype

IDE8410 NIRCA Prototype

Detectors: MCT, InGaAs, PbS, micro-bolometer, Si, CCD
Analogue inputs: 7 (+additional monitoring inputs)
Number of ADCs: 5
ADC Resolution: 12-bit
ADC Sampling Rate: 2 Msps
Number of DACs: 16
Programming interface: SPI
Embedded microcontroller: Custom sequencer with reduced instruction-set
Data interface: 2 high-speed 8b/10b serial interfaces
Control outputs: 32 synchronized arbitrary waveform outputs + 8 control outputs
IDE8411 NIRCA

IDE8411 NIRCA

Detectors: MCT, InGaAs, PbS, micro-bolometer, Si, CCD
Analogue inputs: 8 (+additional monitoring inputs)
Number of ADCs: 5
ADC Resolution: 12-bit
ADC Sampling Rate: 2.2 Msps
Number of DACs: 16
Programming interface: SPI
Embedded microcontrolle: Custom sequencer with reduced instruction-set
Data interface: 2 high-speed 8b/10b serial interfaces
Control outputs: 32 synchronized arbitrary waveform outputs + 8 control outputs
IDE8420 NIRCA MkII

IDE8420 NIRCA MkII

Detectors: MCT, InGaAs, PbS, micro-bolometer, Si, CCD
Analogue inputs: 16 (+additional monitoring inputs)
Number of ADCs: 16
ADC Resolution: 14-bit
ADC Sampling Rate: 12 Msps
Number of DACs: 8
Programming Interface: SPI
Embedded Microcontroller: Custom sequencer with reduced instruction-set
Control outputs: 16 synchronized arbitrary waveform output
Control inputs: 8 digital inputs
TA32CG3

TA32CG3

Application: Counting, Spectroscopy
Number of inputs: 32
Shaping time: 75 ns - 150 ns
Trigger threshold: Programmable by 3-bit DAC
Trigger outputs: Common trigger
Test and calibration: Internal calibration circuit
VA32HDR14.2

VA32HDR14.2

Application: Imaging, Spectroscopy, Calorimetry
Number of inputs: 32
Input charge range: -2 pC to +13 pC
Shaping time: 2 μs
Nominal capacitive load: 20 pF
Equivalent Noise Charge (ENC): 2700 e + 50 e/pF
Outputs: Multiplexed pulse height and individual output per channel
Test and calibration: Internal calibration circuit and test channel
Power consumption: 3 mW / channel
VA32HDR14.3

VA32HDR14.3

Detectors: Multi-anode photomultiplier (MA-PMT)
Application: Imaging, Spectroscopy, Calorimetry
Number of inputs: 33
Input charge range: -20 pC to +8 pC
Shaping time: 2 μs
Equivalent Noise Charge (ENC): 5200e + 5e/pF
Outputs: Multiplexed pulse height and individual output per channel
Test and calibration: Internal calibration circuit and test channel
Power consumption: 3.4 mW / channel
VASCM3.2

VASCM3.2

Detectors: Silicon, thin-film transistor (TFT) arrays
Detectors: Silicon, thin-film transistor (TFT) arrays
Application: Imaging, Spectroscopy, Calorimetry
Number of inputs: 128
Input charge range: 4 gain settings: ±1 pC, ±2.5 pC, ±6 pC and ±20 pC
Outputs: Multiplexed pulse height with CDS
Test and calibration: Internal calibration circuit
VATA450.3

VATA450.3

Detectors: CZT, CdTe
Detectors: CZT, CdTe
Application: Tracking, Spectroscopy, Calorimetry
Number of inputs: 64
Input charge range: 2 gain settings: ±16 fC, ±40 fC
Shaping time: 4 μs (VA), 0.6 μs (TA)
Nominal capacitive load: 6 pF
Equivalent Noise Charge (ENC): 65e + 19e/pF
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
VATA451

VATA451

Detectors: Silicon
Application: Imaging, Spectroscopy, Tracking
Number of inputs: 64
Input charge range: -1.6 fC to +1.6 fC
Shaping time: 4 μs (VA), 0.6 μs/1.2 μs programmable (TA)
Nominal capacitive load: 5 pF
Equivalent Noise Charge (ENC): 30e + 7e/pF
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
Outputs: Serial digitized pulse height
VATA453

VATA453

Detectors: Germanium (Ge)
Application: Imaging, Spectroscopy, Tracking
Number of inputs: 64
Input charge range: -320 fC to +400 fC
Shaping time: 4.3 µs/4.8 μs (VA), 100 ns/200 ns (TA)
Nominal capacitive load: 35 pF
Equivalent Noise Charge (ENC): 250e + 1.4e/pF
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
Outputs: Serial digitized pulse height
VATA460.3

VATA460.3

Detectors: Silicon (Si)
Application: Imaging, Spectroscopy, Tracking
Number of inputs: 32
Input charge range: ±95 fC
Shaping time: 2 μs
Equivalent Noise Charge (ENC): 179e at no capacitive load
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
Outputs: Serial digitized pulse height
Test and calibration: Calibration circuit and ADC test circuit
VATA461

VATA461

Detectors: CdTe, CZT
Application: Imaging, Spectroscopy, Tracking
Number of inputs: 32
Input charge range: ±5.5 fC
Shaping time: 3 μs (VA), 0.6μs/1.2μs (TA)
Nominal capacitive load: 6 pF
Equivalent Noise Charge (ENC): 77e at nominal capacitive load
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
Outputs: Serial digitized pulse height
VATA462

VATA462

Detectors: Avalanche photodiodes (APD) with BGO scintillator
Application: Imaging, Spectroscopy, Tracking
Number of inputs: 32
Input charge range: ±500 fC
Shaping time: 3 μs (VA), 0.6μs (TA)
Nominal capacitive load: 30 pF
Equivalent Noise Charge (ENC): 325e + 1.2e/pF
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
Outputs: Serial digitized pulse height
VATA64HDR16.2

VATA64HDR16.2

Detectors: SiPM, MPPC
Detectors: SiPM, MPPC
Application: Imaging, Spectroscopy
Number of inputs: 64
Input charge range: -20 pC to 55 pC
Shaping time: 100 ns (VA), 50 ns (TA)
Nominal capacitive load: 200 pF
Equivalent Noise Charge (ENC): 7490e to 9987e
Trigger threshold: Adjustable
Trigger outputs: Common trigger output and TAC (time-to-analog converter) and global off-chip trigger line
VATAGP7.1

VATAGP7.1

Detectors: Si, hybrid photon detector (HPD)
Detectors: Si, hybrid photon detector (HPD)
Application: Counting, Imaging
Number of inputs: 128
Input charge range: ±30 fC
Shaping time: 500ns (VA), 50ns (TA)
Nominal capacitive load: 10 pF
Equivalent Noise Charge (ENC): 70e + 12e/pF
Trigger threshold: Programmable by 5-bit DAC
Trigger outputs: Digital address of triggering channel
VATAGP8

VATAGP8

Detectors: Silicon
Application: Imaging, Spectroscopy, Calorimetry
Number of inputs: 128
Input charge range: -250 fC to +250 fC
Shaping time: 0.5 μs
Nominal capacitive load: 6 pF
Equivalent Noise Charge (ENC): 398e + 5e/pF
Trigger threshold: Adjustable
Trigger outputs: Common trigger output for all channels
Outputs: Multiplexed pulse height